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Welcome to the Shared Instrumentation Facility at the Colorado School of Mines. Our labs bring together advanced equipment, technical expertise, and collaborative…
Mines SIF Lab Tour for IEEE Conference 2025:…
From Anne Steputis
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The Mechanical Testing labs within the Mines Shared Instrumentation Facility (SIF) include a variety of monotonic, fatigue, temperature, and strain measurement…
Hill Hall 173: DSI Gleeble 3500-GTC
From Anne Steputis
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The Mechanical Testing labs within the Mines Shared Instrumentation Facility (SIF) include a variety of monotonic, fatigue, temperature, and strain measurement…
Hill Hall 160: Fatigue Testing
From Anne Steputis
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The Mechanical Testing labs within the Mines Shared Instrumentation Facility (SIF) include a variety of monotonic, fatigue, temperature, and strain measurement…
Hill Hall 151: Servohydraulic Load Frames
From Anne Steputis
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The Mechanical Testing labs within the Mines Shared Instrumentation Facility (SIF) include a variety of monotonic, fatigue, temperature, and strain measurement…
Hill Hall 150: Electromechanical Load Frames…
From Anne Steputis
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The Mechanical Testing labs within the Mines Shared Instrumentation Facility (SIF) include a variety of monotonic, fatigue, temperature, and strain measurement…
Hill Hall 121: Interlaken Servohydraulic Press
From Anne Steputis
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The Mechanical Testing labs within the Mines Shared Instrumentation Facility (SIF) include a variety of monotonic, fatigue, temperature, and strain measurement…
Coorstek 240: Servohydraulic &…
From Anne Steputis
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Welcome to Coorstek 040, a cutting-edge nanofabrication lab housing a diverse set of instruments designed for materials research, thin film deposition, and advanced…
Coorstek 040 Suite: Nanofabrication, Thin Film…
From Anne Steputis
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The FEI Co. Talos F200X 200keV field emission scanning / transmission electron microscope is located in the CoorsTek Building (Room 001P). The FEI X-FEG high brightness…
Coorstek 001P: FEI Talos F200X TEM/STEM
From Anne Steputis
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The TESCAN S8252G is an ultra-high resolution variable pressure Schottky field emission scanning electron microscope/Ga+ focused ion beam instrument for imaging and…
Coorstek 001M: Tescan S8252G Raman-SEM/FIB
From Anne Steputis
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Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly surface-sensitive analytical technique used to obtain elemental, isotopic, and molecular…
Coorstek 001K: IONTOF-SIMS.V
From Anne Steputis
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The Helios NanoLab 600i is a SEM/FIB DualBeam workstation with a Ga ion column for imaging and sample milling and Pt deposition (GIS) capability. Nanoscale chemical…
Coorstek 001J: FEI Helios NanoLab 600i FIB/SEM
From Anne Steputis
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The LEAP 4000X Si local electrode atom probe provides 3D nanoscale compositional analysis. Mass spectral data obtained through time-of-flight measurements can be used…
Coorstek 001F: Camera Leap 4000X SI Atom Probe
From Anne Steputis
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The Rocky Mountain Environmental X-ray Photoelectron Spectroscopy (E-XPS) center is a user facility for state-of-the-art surface analysis measurements.XPS measures…
Coorstek 001D: Rocky Mountain Environmental XPS…
From Anne Steputis
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The Zeiss Xradia Versa 3D X-ray microscope enables cutting-edge, nondestructive tomographic imaging and grain reconstruction. X-ray tomography (μ-XCT) allows for the…
Coorstek 001C: Zeiss Xradia Versa 3D X-ray…
From Anne Steputis
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The Panalytical Empyrean X-ray diffractometer provides crystallographic and compositional information critical to understanding part mechanical performance. It features…
Coorstek 001C: Panalytical Empyrean X-ray…
From Anne Steputis
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