Coorstek 001D: Rocky Mountain Environmental XPS (EXPS)
From Anne Steputis
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From Anne Steputis
The Rocky Mountain Environmental X-ray Photoelectron Spectroscopy (E-XPS) center is a user facility for state-of-the-art surface analysis measurements.
XPS measures material surface compositions by measuring the intensity of photoelectrons emitted as a function of the incident X-ray energy. Spectra features are used to identify the surface species present and calculate the fraction of the surface occupied by each.
The Rocky Mountain E-XPS extends these traditional capabilities by enabling measurements in a range of environmental conditions.
The instrument, based on the HiPP lab system from Scienta Omicron, can measure XPS at various pressures and temperatures, and with variable chemical compositions.
Unlike traditional UHV XPS systems, the Rocky Mountain E-XPS can therefore look at surface states for functional materials in relevant environments and with optional electronic biasing for analysis of non-equilibrated surface states.
SOURCE
The HiPP Lab from Scienta Omicron utilizes a high power, high energy resolution monocrhomated Al-Kα source with 600 W continuous operation and modified for near-ambient pressure XPS measurements.’
ANALYZER
The energy analyzer boasts the following specifications:
The analyzer can operate in standard transmission mode, or collect one-shot measurements to analyze spectra as a function of X-ray energy and either angle (angular mode) or lateral position (spatial mode).