Coorstek 001P: FEI Talos F200X TEM/STEM

The FEI Co. Talos F200X 200keV field emission scanning / transmission electron microscope is located in the CoorsTek Building (Room 001P). The FEI X-FEG high brightness electron source delivers high total current — up to five times the beam current of a standard Schottky FEG — while the integrated EDS system with four silicon drift detectors (SDDs) offers mapping capabilities of up to 105 spectra/sec. It has a TEM information limit better than 0.12 nm. The STEM probe allows for an imaging resolution of 0.16 nm. STEM images can be viewed in bright field or with multiple dark field detectors, including a high-angle annular dark field detector (HAADF) allowing for Z-contrast imaging.

• Schottky Field Emission Gun
• Up to 200kV Accelerating Voltage
• Conventional and Scanning Modes (TEM/STEM)
• High Resolution (HREM): 0.12 nm Information Limit
• Super-X EDS for Spectral Imaging
• High Angle Annular (HAADF) and Centered (CDF) Dark Field Modes

NanoMegas ASTAR

• Spatial Resolution: down to ~2nm for orientation maps.
• Precession angle: 0.5 to 1 degree
• Has digital scan generator – no need for STEM unit
• Scanning step from 0.1 nm to 100 nm with maximum scanning area of 5×5 microns
• Applications:  Crystallographic orientation and phase mapping of polycrystalline films and precipitates in matrix materials

MerlinEM Direct Electron Detector

• Noiseless data
• Zero dark counts
• Direct detection
• Radiation tolerant
• 30 – 300 keV detection
• Up to 2000 fps 12 bit mode
• 30 keV – 300 keV operation
• Active area: 14 x 14 mm (256 x 256 pixels)