Coorstek 001F: Camera Leap 4000X SI Atom Probe

The LEAP 4000X Si local electrode atom probe provides 3D nanoscale compositional analysis.  Mass spectral data obtained through time-of-flight measurements can be used to identify light mass and heavy mass species (hydrogen out to >1000 Da) with equivalent sensitivity.  The mass resolution is sufficient for distinguishing isotopic abundances.  The instrument features both laser pulsing and voltage pulsing along with a 90 mm to 160 mm variable flight path.

• Mass resolution (FWHM)* : Voltage Pulse Mode 1:1500 ; Laser Pulse Mode 1:500
• Mass resolution (FWTM)*: Voltage Pulse Mode 1:180 ; Laser Pulse Mode 1:650
• Mass resolution (FW1%M)*: Voltage Pulse Mode n/a ; Laser Pulse Mode 1:400
• Maximum pulse rate (kHx): Voltage Pulse Mode 200 ; Laser Pulse Mode 1,000
• Base pressure on 50K specimen (Torr) : <1E – 10
• Minimum specimen temperature (K) : 25
• Achievable field of view (nm) : 250
• Lateral resolution (nm): 0.2
• Depth resolution (nm): 0.05
• IVAS advanced data analysis software for reconstruction, visualization and analysis of atom probe data sets
• Plasma cleaner interfaced to load lock provides surface contamination removal

*For standard AI specimen