The Panalytical Empyrean X-ray diffractometer provides crystallographic and compositional information critical to understanding part mechanical performance. It features small- and wide-angle X-ray scattering (SAXS/WAXS) and has the ability to test samples at temperatures ranging from −200 °C to 1100 °C. It can also capture information on texture, residual stress and pair distribution functions.
- Cu and Mo radiation for low- and high-energy X-ray diffraction (XRD)
- Reflection/transmission geometry with rotating sample for improved statistics
- Spinning capillary
- Bragg–Brentano optics and focusing geometry
- Residual strain measurements
- Cu/Mo focusing mirror and monocapillary 100 µm beam for microdiffraction
- 5-axis Eulerian cradle for texture mapping
- SAXS/WAXS
- Grazing incidence XRD
- Pair distribution function
- Galipix 3D area detector
In situ stages from −190 up to 1100 °C (−328 to 2012 °F) with 3-axis cradle
- Cr, Cu and Mo X-ray tubes available for variety of measurements
- Cr base high resolution residual stress including parallel beam optic and microbeam dual mask set